Sub-picosecond laser induced damage test facility for petawatt reflective optical components characterizations

Martin Sozet; Jérôme Néauport; Eric Lavastre; Nadja Roquin; Laurent Gallais; Laurent Lamaignère

doi:10.1117/12.2178734

12 May 2015 Sub-picosecond laser induced damage test facility for petawatt reflective optical components characterizations

Martin Sozet, Jérôme Néauport, Eric Lavastre, Nadja Roquin, Laurent Gallais, Laurent Lamaignère

Author Affiliations +

Proceedings Volume 9513, High-Power, High-Energy, and High-Intensity Laser Technology II; 951316 (2015) https://doi.org/10.1117/12.2178734
Event: SPIE Optics + Optoelectronics, 2015, Prague, Czech Republic

Abstract

While considering long pulse or short pulse high power laser facilities, optical components performances and in particular laser damage resistance are always factors limiting the overall system performances. Consequently, getting a detailed knowledge of the behavior of these optical components under irradiations with large beam in short pulse range is of major importance. In this context, a Laser Induced Damage Threshold test facility called DERIC has been developed at the Commissariat à l’Energie Atomique et aux Energies Alternatives, Bordeaux. It uses an Amplitude Systemes laser source which delivers Gaussian pulses of 500 fs at 1053 nm. 1-on-1, S-on-1 and RasterScan test procedures are implemented to study the behavior of monolayer and multilayer dielectric coatings.

Citation Download Citation

Martin Sozet, Jérôme Néauport, Eric Lavastre, Nadja Roquin, Laurent Gallais, and Laurent Lamaignère "Sub-picosecond laser induced damage test facility for petawatt reflective optical components characterizations", Proc. SPIE 9513, High-Power, High-Energy, and High-Intensity Laser Technology II, 951316 (12 May 2015); https://doi.org/10.1117/12.2178734

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