Cross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer

Ch. Taudt; T. Baselt; G. Oreski; Ch. Hirschl; E. Koch; P. Hartmann

doi:10.1117/12.2184814

22 June 2015 Cross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer

Ch. Taudt, T. Baselt, G. Oreski, Ch. Hirschl, E. Koch, P. Hartmann

Author Affiliations +

Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 95250P (2015) https://doi.org/10.1117/12.2184814
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

This work analyses samples of the widely used encapsulant of photovoltaics modules, ethylene vinyl acetate (EVA). The samples were cross-linked using a lamination technique for different curing times (0 - 20 minutes). The cross-linking characterization is done by determinating the material dispersion with the aid of a combined temporal- and spectral domain white-light interferometer. With the proposed technique it was possible to discriminate the differences in crosslinking for the given curing times. One important feature of this approach is the possibility to perform space resolved measurements of the crosslinking state with μm-resolution. Furthermore the paper discusses the mathematical analysis and processing of measurement data and shows a prototype solution for the fast and automated data acquisition for industrial application.

Citation Download Citation

Ch. Taudt, T. Baselt, G. Oreski, Ch. Hirschl, E. Koch, and P. Hartmann "Cross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95250P (22 June 2015); https://doi.org/10.1117/12.2184814

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