Paper
16 January 1989 Optical Surface Inspection Using A Transverse Speckle Detection Technique
A. Oulamara, G. Tribillon, M. Spajer, J. Duvernoy
Author Affiliations +
Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947605
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
A method that achieves automatic measurements of the orthogonal components of the motion of optically rough surfaces is described. An optical set-un that implements a speckle rotation is used to extract the components of 2-D displacements, which are obtained from simultaneous data recording performed by a single 1-D CCD line. A temporal analysis of speckle patterns related with a given inspected area of a moving structure is then possible. The movement trajectory is reconstructed. The principle of the method and the experimental set-up are described. Experimental results are shown with a specific application to the deformations of a video film structure under directional traction and dynamic analysis of thermal deformations of mechanical parts.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Oulamara, G. Tribillon, M. Spajer, and J. Duvernoy "Optical Surface Inspection Using A Transverse Speckle Detection Technique", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947605
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KEYWORDS
Speckle

Speckle pattern

Charge-coupled devices

Inspection

Photodetectors

Optical testing

Signal processing

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