Development of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules

Thomas C. Felder; William J. Gambogi Jr.; James G. Kopchick; Lucas Amspacher; R. Scott Peacock; Benjamin Foltz; Katherine M. Stika; Alexander Z. Bradley; Babak Hamzavy; Bao-Ling Yu; Lucie Garreau-iles; Oakland Fu; Hongjie Hu; T. John Trout

doi:10.1117/12.2188627

23 September 2015 Development of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules

Thomas C. Felder, William J. Gambogi Jr., James G. Kopchick, Lucas Amspacher, R. Scott Peacock, Benjamin Foltz, Katherine M. Stika, Alexander Z. Bradley, Babak Hamzavy, Bao-Ling Yu, Lucie Garreau-iles, Oakland Fu, Hongjie Hu, T. John Trout

Author Affiliations +

Proceedings Volume 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII; 956303 (2015) https://doi.org/10.1117/12.2188627
Event: SPIE Optics + Photonics for Sustainable Energy, 2015, San Diego, California, United States

Abstract

Matching accelerated test results to field observations is an important objective in the photovoltaic industry. We continue to develop test methods to strengthen correlations. We have previously reported good correlation of FTIR spectra between accelerated tests and field measurements. The availability of portable FTIR spectrometers has made measurement in the field convenient and reliable. Recently, nano-indentation has shown promise to correlate changes in backsheet mechanical properties. A precisely shaped stylus is pressed into a sample, load vs displacement recorded and mechanical properties of interest calculated in a nondestructive test. This test can be done on full size modules, allowing area variations in mechanical properties to be recorded. Finally, we will discuss optical profilometry. In this technique a white light interferogram of a surface is Fourier transformed to produce a three-dimensional image. Height differences from 1 nm to 5 mm can be detected over an area of a few cm. This technique can be used on minimodules, and is useful to determine crack and defect dimensions. Results will be presented correlating accelerated tests with fielded modules covering spectroscopic, mechanical, and morphological changes.

Conference Presentation

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Thomas C. Felder, William J. Gambogi Jr., James G. Kopchick, Lucas Amspacher, R. Scott Peacock, Benjamin Foltz, Katherine M. Stika, Alexander Z. Bradley, Babak Hamzavy, Bao-Ling Yu, Lucie Garreau-iles, Oakland Fu, Hongjie Hu, and T. John Trout "Development of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules", Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 956303 (23 September 2015); https://doi.org/10.1117/12.2188627

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