Fringe Recognition Of The In-Plane Moire And Isochromatic Patterns

J. Fang; H. M. Shi; X. J. Su

doi:10.1117/12.948030

27 January 1989 Fringe Recognition Of The In-Plane Moire And Isochromatic Patterns

J. Fang, H. M. Shi, X. J. Su

Proceedings Volume 0965, Current Developments in Optical Engineering III; (1989) https://doi.org/10.1117/12.948030
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

An automatic procedure of ordering fringes of the in-plane moire and the isochromatic patterns is proposed. The rotational mismatch is used in moire test and a bending beam is superimposed on the photoelastic specimen to generate straight-line carriers before the deformation. The in-plane displacement and the relative retardation of birefringence are encoded respectively as the modulation to the carriers. The resultant fringes are digitally processed by autotracking, interpolation and demodulation to number the fringe-order and to realize a whole-field compensation automatically.

Citation Download Citation

J. Fang, H. M. Shi, and X. J. Su "Fringe Recognition Of The In-Plane Moire And Isochromatic Patterns", Proc. SPIE 0965, Current Developments in Optical Engineering III, (27 January 1989); https://doi.org/10.1117/12.948030

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