Research on testing system for optical surface based on polarizing coherent technology

De-wei Huang; Min Wang; Fen Wang

doi:10.1117/12.2240552

27 September 2016 Research on testing system for optical surface based on polarizing coherent technology

De-wei Huang, Min Wang, Fen Wang

Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 96840V (2016) https://doi.org/10.1117/12.2240552
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China

Abstract

The optical surface deviation of the lens can directly affect the quality of the optical system. In order to improve efficiency and accuracy of optical surface detection, an on-line testing system for optical surface based on polarizing coherent technology is designed and developed. No lying walls are required for the lens. In other words, they can be checked out the deviation of radius of curvature and astigmatism online. Based on the Tyman-Green interference light path, the system joins the polarization interference measuring technology. This paper makes a theoretical derivation and ZEMAX software simulation on the light path, sets up the experimental light path of the system. At last, comparison on image of Tyman-Green interference technology, the contrast of interference fringe image is improved significantly after joining polarizing coherent technology. And background noise and stray light are significantly reduced. It provides the foundation for improving the precision of image processing.

Citation Download Citation

De-wei Huang, Min Wang, and Fen Wang "Research on testing system for optical surface based on polarizing coherent technology", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96840V (27 September 2016); https://doi.org/10.1117/12.2240552

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available