Paper
9 March 2016 Experimental and analysis considerations for transmission/reflection spectrograms used in ultrafast x-ray pulse diagnostics
Daniel J. Kane, Nick Hartmann, Ryan N. Coffee, Alan R. Fry
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Abstract
Ultrafast time-dependent optical reflection and/or transmission spectroscopy can be used to measure time responses of materials and time arrivals between two unrelated ultrafast pulses. For example, a pump pulse, such as an x-ray pulse, excites a material, changing its refractive index. A spectrogram monitoring the change of intensity of a reflected or transmitted optical probe pulse can be used to indirectly monitor the refractive index change. Standard spectrogram deconvolution methods can be used to extract characteristics of both the material response and the probe pulse, but care must be taken to consider any experimental artifacts.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel J. Kane, Nick Hartmann, Ryan N. Coffee, and Alan R. Fry "Experimental and analysis considerations for transmission/reflection spectrograms used in ultrafast x-ray pulse diagnostics", Proc. SPIE 9740, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XVI, 97400H (9 March 2016); https://doi.org/10.1117/12.2213628
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Cited by 2 scholarly publications.
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KEYWORDS
X-rays

X-ray optics

Silicon

Diamond

Optical filters

Ultrafast phenomena

Free electron lasers

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