Presentation + Paper
15 September 2016 Tip-enhanced Raman spectroscopy of nanostructures on epitaxial graphene and graphene microisland
Sanpon Vantasin, Toshiaki Suzuki, Yoshito Tanaka, Yasutaka Kitahama, Shohei Uemura, Doujima Daichi, Tadaaki Kaneko, Yukihiro Ozaki
Author Affiliations +
Abstract
Despite often illustrated as a perfect two-dimensional sheet, real graphene sample is not always flat. Nanostructures can be occurred on graphene sheet, especially for epitaxial graphene. The nanostructures alter the electrical and mechanical properties of graphene. This is crucial for epitaxial graphene since its main potential is in the electronics and optics application. This study investigates nanostructures on epitaxial graphene by tip-enhanced Raman spectroscopy, which is a technique that can provide Raman spectra with great spatial resolution, exceeding the diffraction limit of light. The results suggest that the compressive strain on nanoridges is weaker compared to neighbor flat area, supporting the ‘ridge as compressive strain relaxation’ mechanism. TERS measurement of nanoridges on epitaxial graphene microisland also indicates that the ‘Si vapor trapping’ mechanism for ridge formation is unlikely to occur.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sanpon Vantasin, Toshiaki Suzuki, Yoshito Tanaka, Yasutaka Kitahama, Shohei Uemura, Doujima Daichi, Tadaaki Kaneko, and Yukihiro Ozaki "Tip-enhanced Raman spectroscopy of nanostructures on epitaxial graphene and graphene microisland", Proc. SPIE 9925, Nanoimaging and Nanospectroscopy IV, 99250Q (15 September 2016); https://doi.org/10.1117/12.2237536
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KEYWORDS
Graphene

Raman spectroscopy

Silicon carbide

Nanostructures

Atomic force microscopy

Silicon

Spatial resolution

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