CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume PC11970 > Article
Presentation
2 March 2022 Deep residual network with data consistency for subsampled Fourier ptychographic microscopy
Hyeon Gyu Kim, Kyung Won Kim, Kyung Chul Lee, Tae Joon Eo, Kyungwon Lee, Yohan Jun, Seung Ah Lee, Do Sik Hwang
Author Affiliations +
Proceedings Volume PC11970, Quantitative Phase Imaging VIII; PC119700B (2022) https://doi.org/10.1117/12.2609572
Event: SPIE BiOS, 2022, San Francisco, California, United States
Abstract
Fourier Ptychographic Microscopy (FPM) is a computational imaging technique which reconstructs super-resolved amplitude and phase images by combining variably illuminated low-resolution images through an iterative phase retrieval algorithm. However, the phase-retrieval-based reconstruction requires sufficient overlap between spatial frequency bands of the measurements, which creates a trade-off between the number of measurements and the reconstruction quality. We propose a deep-learning-based FPM reconstruction that recovers both amplitude and phase images in high resolution with far fewer measurements than conventional FPM, with model-based constraint. Our model works with almost no overlap between low-resolution measurements in the Fourier domain, only taking into account the total Fourier extent of the measurements.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Hyeon Gyu Kim, Kyung Won Kim, Kyung Chul Lee, Tae Joon Eo, Kyungwon Lee, Yohan Jun, Seung Ah Lee, and Do Sik Hwang "Deep residual network with data consistency for subsampled Fourier ptychographic microscopy", Proc. SPIE PC11970, Quantitative Phase Imaging VIII, PC119700B (2 March 2022); https://doi.org/10.1117/12.2609572
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Data modeling
Microscopy
Performance modeling
Reconstruction algorithms
Phase measurement
Phase retrieval
Image retrieval
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top