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5 March 2022 Wavefront sensors and adaptive optics for optical metrology, laser and microscopy
Xavier Levecq, Rafael Porcar, Pauline Treimany
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Proceedings Volume PC12008, Photonic Instrumentation Engineering IX; PC120080B (2022) https://doi.org/10.1117/12.2607789
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
We will present a new approach of linearized focal plane technique (LIFT), formerly developed by ONERA, which results in an improvement of a factor of 16 (4x4) of the spatial resolution. This technology is based on the combination of standard SH technology with phase retrieval algorithms applied on all spots of the microlens array that provides information on high spatial frequencies. We will show some measurements performed on extremely complex wavefronts. This technology presents very promising perspectives for optical and freeform metrology and can advantageously replace, at lower cost and better usability, Fizeau interferometry.
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Xavier Levecq, Rafael Porcar, and Pauline Treimany "Wavefront sensors and adaptive optics for optical metrology, laser and microscopy", Proc. SPIE PC12008, Photonic Instrumentation Engineering IX, PC120080B (5 March 2022); https://doi.org/10.1117/12.2607789
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KEYWORDS
Wavefront sensors
Interferometry
Optical resolution
Spatial resolution
Wavefronts
New and emerging technologies
Phase retrieval
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