In situ wide-field third harmonic generation microscopy for monitoring femtosecond laser-induced defects

Olivier Bernard; Andrea Kraxner; Assim Boukhayma; Jeff Squier; Christian Enz; Yves Bellouard

doi:10.1117/12.2649090

17 March 2023 In situ wide-field third harmonic generation microscopy for monitoring femtosecond laser-induced defects

Olivier Bernard, Andrea Kraxner, Assim Boukhayma, Jeff Squier, Christian Enz, Yves Bellouard

Proceedings Volume PC12411, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXIII; PC124110Q (2023) https://doi.org/10.1117/12.2649090
Event: SPIE LASE, 2023, San Francisco, California, United States

Abstract

This presentation was prepared for SPIE LASE 2023.

Conference Presentation

Citation Download Citation

Olivier Bernard, Andrea Kraxner, Assim Boukhayma, Jeff Squier, Christian Enz, and Yves Bellouard "In situ wide-field third harmonic generation microscopy for monitoring femtosecond laser-induced defects", Proc. SPIE PC12411, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXIII, PC124110Q (17 March 2023); https://doi.org/10.1117/12.2649090

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