Presentation
15 March 2023 Subcycle field microscopy via quantum dots resolves ultrafast THz nearfields
Author Affiliations +
Abstract
In this contribution, we present a novel type of sub-cycle field-resolved microscopy of Terahertz electric near-fields inside micro- and nanostructures. The “Quantum-probe Field Microscopy” (QFIM) scheme is based on fluorescence microscopy of semiconductor Quantum-dot luminescence and harnesses the Quantum-confined Stark effect for recording stroboscopic “movies” of ultrafast resonant and propagating THz-excitations. The scheme is compatible with strong local driving field strengths, sub-micrometer resolution and sub-cycle sampling of multi-THz waveforms. We discuss experimental implementations, recent results and future prospects of this versatile microscopy scheme.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Georg Herink, Moritz B. Heindl, Nicholas Kirkwood, Tobias Lauster, Julia A. Lang, Markus Retsch, and Paul Mulvaney "Subcycle field microscopy via quantum dots resolves ultrafast THz nearfields", Proc. SPIE PC12419, Ultrafast Phenomena and Nanophotonics XXVII, (15 March 2023); https://doi.org/10.1117/12.2649200
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KEYWORDS
Microscopy

Quantum dots

Ultrafast phenomena

Luminescence

Ultrafast imaging

Light wave propagation

Near field

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