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In this contribution, we present a novel type of sub-cycle field-resolved microscopy of Terahertz electric near-fields inside micro- and nanostructures. The “Quantum-probe Field Microscopy” (QFIM) scheme is based on fluorescence microscopy of semiconductor Quantum-dot luminescence and harnesses the Quantum-confined Stark effect for recording stroboscopic “movies” of ultrafast resonant and propagating THz-excitations. The scheme is compatible with strong local driving field strengths, sub-micrometer resolution and sub-cycle sampling of multi-THz waveforms. We discuss experimental implementations, recent results and future prospects of this versatile microscopy scheme.
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Georg Herink, Moritz B. Heindl, Nicholas Kirkwood, Tobias Lauster, Julia A. Lang, Markus Retsch, Paul Mulvaney, "Subcycle field microscopy via quantum dots resolves ultrafast THz nearfields," Proc. SPIE PC12419, Ultrafast Phenomena and Nanophotonics XXVII, (15 March 2023); https://doi.org/10.1117/12.2649200