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13 March 2024 Single-shot measurement of the intensity and phase of optical waveforms using 70 GHz electronics
Daniel J. Kane
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Proceedings Volume PC12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX; PC1287003 (2024) https://doi.org/10.1117/12.3005044
Event: SPIE LASE, 2024, San Francisco, California, United States
Abstract
We present new work demonstrating the single-shot measurement of the intensity and phase of sub-picosecond optical pulses and waveforms without ambiguity at measurement times of 1 microsecond. While the technique has an optical front-end, back-end detection is done using 70 GHz electronics effectively extending the bandwidth of the electronics by a factor of 20-50. Measurements were made using both multishot and single-shot approaches. Multishot pulses were compared to separate cross-Frequency Resolved Optical Gating (X-FROG) measurements. Generation of the test pulses, as well as measurement results, will be presented.
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Daniel J. Kane "Single-shot measurement of the intensity and phase of optical waveforms using 70 GHz electronics", Proc. SPIE PC12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX, PC1287003 (13 March 2024); https://doi.org/10.1117/12.3005044
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KEYWORDS
High speed electronics
Optical filters
Phase retrieval
Multiplexing
Oscilloscopes
Phase measurement
Photodiodes
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