Electro-optic-based characterization of a THz FEL

Pietro Musumeci; Maximillian Lenz

doi:10.1117/12.3010556

13 March 2024 Electro-optic-based characterization of a THz FEL

Pietro Musumeci, Maximillian Lenz

Proceedings Volume PC12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX; PC128700C (2024) https://doi.org/10.1117/12.3010556
Event: SPIE LASE, 2024, San Francisco, California, United States

Abstract

Extremely high beam-to-radiation energy conversion efficiencies can be obtained in a THz FEL using a strongly tapered helical undulator at the zero-slippage resonant condition, where a circular waveguide is used to match the radiation group velocity to the electron beam longitudinal velocity. We report on single-shot Electro-Optic Sampling (EOS) based measurements of the broadband THz FEL radiation pulses emitted in this regime. The technique allows full reconstruction of the THz field waveform. The measurements are performed varying the input electron beam energy in the undulator providing insights on the complex dynamics in a waveguide FEL.

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Citation Download Citation

Pietro Musumeci and Maximillian Lenz "Electro-optic-based characterization of a THz FEL", Proc. SPIE PC12870, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IX, PC128700C (13 March 2024); https://doi.org/10.1117/12.3010556

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KEYWORDS

Electro optics

Terahertz radiation

Free electron lasers

Birefringence

Crystals

Electric fields

Femtosecond pulse shaping

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