Poster
20 June 2024 Label-free super-resolved polarimetry on nanomaterials
Author Affiliations +
Conference Poster
Abstract
Our study introduces a new method for label-free super-resolved polarimetry on nanomaterials, compatible with in-situ analysis. Integrating Image Scanning Microscopy (ISM) with polarimetry techniques, we achieve remarkable resolutions down to 90 nm while acquiring polarization information. Overcoming limitations associated with fluorophores in challenging materials, our approach facilitates quantitative measurements of optical properties. Applied successfully to nanostructured surfaces created by femtosecond lasers and boron nitride nanotubes, our work showcases the versatility of this methodology.
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jose-Alberto Aguilar Mora, Duc-Minh Ta, Jean-Baptiste Marceau, Javier Prada Rodrigo, Sedao XXX, Etienne Gaufrès, Cyril Mauclair, and Pierre Bon "Label-free super-resolved polarimetry on nanomaterials", Proc. SPIE PC13005, Laser + Photonics for Advanced Manufacturing , PC1300511 (20 June 2024); https://doi.org/10.1117/12.3024419
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KEYWORDS
Nanomaterials

Polarimetry

Biological imaging

Polarization

Super resolution

Fluorophores

Image resolution

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