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14 May 2019 Hybrid CMOS detectors for the Lynx x-ray surveyor high definition x-ray imager
Samuel V. Hull, Abraham D. Falcone, Evan Bray, Mitchell Wages, Maria McQuaide, David N. Burrows
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Journal of Astronomical Telescopes, Instruments, and Systems, Vol. 5, Issue 2, 021018 (May 2019). https://doi.org/10.1117/1.JATIS.5.2.021018
Abstract
X-ray hybrid CMOS detectors (HCDs) are a promising candidate for future x-ray missions requiring high throughput and fine angular resolution along with large field-of-view, such as the high-definition x-ray imager (HDXI) instrument on the Lynx x-ray surveyor mission concept. These devices offer fast readout capability, low power consumption, and radiation hardness while maintaining high detection efficiency from 0.2 to 10 keV. In addition, x-ray hybrid CMOS sensors may be fabricated with small pixel sizes to accommodate high-resolution optics and have shown great improvements in recent years in noise and spectral resolution performance. In particular, 12.5-μm pitch prototype devices that include in-pixel correlated double sampling capability and crosstalk eliminating capacitive transimpedance amplifiers, have been fabricated and tested. These detectors have achieved read noise as low as 5.4 e  −  , and we measure the best energy resolution to be 148 eV (2.5%) at 5.9 keV and 78 eV (14.9%) at 0.53 keV. We will describe the characterization of these prototype small-pixel x-ray HCDs, and we will discuss their applicability to the HDXI instrument on Lynx.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
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Samuel V. Hull, Abraham D. Falcone, Evan Bray, Mitchell Wages, Maria McQuaide, and David N. Burrows "Hybrid CMOS detectors for the Lynx x-ray surveyor high definition x-ray imager," Journal of Astronomical Telescopes, Instruments, and Systems 5(2), 021018 (14 May 2019). https://doi.org/10.1117/1.JATIS.5.2.021018
Received: 31 October 2018; Accepted: 15 April 2019; Published: 14 May 2019
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Cited by 13 scholarly publications.
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KEYWORDS
X-rays
Sensors
X-ray detectors
X-ray imaging
CMOS sensors
Silicon
Spatial resolution
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