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1 October 2010 Near-field intensity correlations on nanoscaled random silver/dielectric films
Julien Laverdant, Stephanie Buil, Jean-Pierre Hermier, Xavier Quelin
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Journal of Nanophotonics, Vol. 4, Issue 1, 049505 (October 2010). https://doi.org/10.1117/1.3506519
Abstract
Near-field intensity distributions in inhomogeneous silver nanostructures were investigated using near-field optical microscopy. By varying the metallic concentration and the excitation wavelength, different plasmon scattering regimes were addressed and identified using statistical analysis tools such as the probability density function and intensity auto-correlation function. The intensity correlation length was found to indicate an intermediate regime where both surface scattering and plasmon localization coexist on the same scale.
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Julien Laverdant, Stephanie Buil, Jean-Pierre Hermier, and Xavier Quelin "Near-field intensity correlations on nanoscaled random silver/dielectric films," Journal of Nanophotonics 4(1), 049505 (1 October 2010). https://doi.org/10.1117/1.3506519
Published: 1 October 2010
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Cited by 5 scholarly publications.
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KEYWORDS
Scattering
Near field
Plasmons
Near field scanning optical microscopy
Silver
Light scattering
Statistical analysis
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