Four-map absolute distance contouring

Xinjun Xie; Michael J. Lalor; David R. Burton; Michael Mason Shaw

doi:10.1117/1.601480

1 September 1997 Four-map absolute distance contouring

Xinjun Xie, Michael J. Lalor, David R. Burton, Michael Mason Shaw

Optical Engineering, Vol. 36, Issue 9, (September 1997). https://doi.org/10.1117/1.601480

A new method called four-map absolute distance contouring, based on the shadow moire´ technique, is described. In this system, the period of a sinusoidal grating is varied through its rotation, with the effect that the phase of the moire´ pattern is also changed. By selecting suitable rotation angles, four images at different grating positions are acquired, from which the absolute distance from the object to the grating can be determined. The theoretical analysis is presented for the method, which has been verified by suitable laboratory experimentation. The measurable range is directly proportional to the period of the grating and inversely proportional to the angles through which the grating is rotated. The results show that the method is fast and accurate.

Citation Download Citation

Xinjun Xie, Michael J. Lalor, David R. Burton, and Michael Mason Shaw "Four-map absolute distance contouring," Optical Engineering 36(9), (1 September 1997). https://doi.org/10.1117/1.601480

Published: 1 September 1997

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available