Measurement of nonoptical surfaces for Poisson's ratio value analysis by oblique incidence interferometry

Yukitoshi Otani; Naoko Okuhara; Toru Yoshizawa

doi:10.1117/1.601612

1 January 1998 Measurement of nonoptical surfaces for Poisson's ratio value analysis by oblique incidence interferometry

Yukitoshi Otani, Naoko Okuhara, Toru Yoshizawa

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Optical Engineering, Vol. 37, Issue 1, (January 1998). https://doi.org/10.1117/1.601612

Conventional interferometers are not always appropriate for measurement of rough or uneven nonoptical surfaces. In this paper, oblique incidence interferometry with a spatial phase-shifting technique is proposed for the solution of this problem. This technique can analyze surface profiles using only one image that contains a high carrier frequency, and a mechanical shifting device that requires high repeatability is not necessary. Therefore, more accurate and quick measurement can be realized. To verify this principle, Poisson’s ratio of brittle materials is determined. The surface deformation due to pure bending is measured so that Poisson’s ratio can be calculated by the relationship between two contour patterns of deformation before and after bending.

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Yukitoshi Otani, Naoko Okuhara, and Toru Yoshizawa "Measurement of nonoptical surfaces for Poisson's ratio value analysis by oblique incidence interferometry," Optical Engineering 37(1), (1 January 1998). https://doi.org/10.1117/1.601612

Published: 1 January 1998

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