Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides

Katsumasa Iwai; Yukio Abe; Yuji Matsuura; Mitsunobu Miyagi

doi:10.1117/1.1485090

1 July 2002 Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides

Katsumasa Iwai, Yukio Abe, Yuji Matsuura, Mitsunobu Miyagi

Optical Engineering, Vol. 41, Issue 7, (July 2002). https://doi.org/10.1117/1.1485090

An idea of an equivalent refractive index for the ray tracing calculation of hollow core waveguides is proposed. A virtual, complex refractive index is uniquely found by minimizing the difference between reflectivity of a virtual monolayer material and a metal substrate coated with a dielectric film. By using this technique, transmission losses of a delivery system consisting of a hollow fiber and a tapered hollow waveguide are calculated.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Katsumasa Iwai, Yukio Abe, Yuji Matsuura, and Mitsunobu Miyagi "Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides," Optical Engineering 41(7), (1 July 2002). https://doi.org/10.1117/1.1485090

Published: 1 July 2002

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