Two-dimensional optical measurement techniques based on optical birefringence effects

Yongchang Zhu; Tatsuo Takada; Yoshihiro Murooka

doi:10.1117/1.1510535

1 December 2002 Two-dimensional optical measurement techniques based on optical birefringence effects

Yongchang Zhu, Tatsuo Takada, Yoshihiro Murooka

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Optical Engineering, Vol. 41, Issue 12, (December 2002). https://doi.org/10.1117/1.1510535

Some dielectric materials become birefringent when subjected to an external force, such as an electric field or a mechanical force. For more than a decade, our research group has been engaged in developing two-dimensional optical measurement techniques for the dynamic measurement of charge distributions on a dielectric surface using the electro-optic Pockels effect, the dynamic measurement of electrical field distributions in a liquid using the electro-optic Kerr effect, and the measurement of birefringence vector distributions in plastic plates using the photoelastic effect. The system nonuniformity and the system reliability are the inevitable problems in two-dimensional measurement systems, and make two-dimensional measurements quite different from point measurements. The common image-processing techniques that have been specially developed to overcome these problems are analyzed and summarized; detailed mathematical analysis is avoided.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Yongchang Zhu, Tatsuo Takada, and Yoshihiro Murooka "Two-dimensional optical measurement techniques based on optical birefringence effects," Optical Engineering 41(12), (1 December 2002). https://doi.org/10.1117/1.1510535

Published: 1 December 2002

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