X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer

Kevin L. Baker

doi:10.1117/1.3205036

1 August 2009 X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer

Kevin L. Baker

Author Affiliations +

Optical Engineering, Vol. 48, Issue 8, 086501 (August 2009). https://doi.org/10.1117/1.3205036

Abstract

We present the design and simulations of the expected performance of a novel 2-D x-ray shearing interferometer. This interferometer uses crossed phase gratings in a single plane, and is capable of operation over a wide range of energies extending from several hundred electron volts to tens of kiloelectron volts by varying the grating material and thickness. This interferometer is insensitive to vibrations and, unlike Moiré deflectometers implemented in the hard x-ray regime, recovers the full 2-D phase profile of the x-ray beam rather than the gradient in only one dimension.

©(2009) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Kevin L. Baker "X-ray wavefront analysis and phase reconstruction with a two-dimensional shearing interferometer," Optical Engineering 48(8), 086501 (1 August 2009). https://doi.org/10.1117/1.3205036

Published: 1 August 2009

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