Dr. Joerg Bischoff Profile

Dr. Joerg Bischoff

CEO at OSIRES

SPIE Involvement:

Author

Area of Expertise:

Optical Design , Diffractive Optics , Electromagnetic Modeling , Optical Scatterometry , Optical Lithography , Astronomical Instrumentation

Websites:

Company Website

Conference Committee Involvement (10)

Modeling Aspects in Optical Metrology X

23 June 2025 | Munich, Germany

Modeling Aspects in Optical Metrology IX

26 June 2023 | Munich, Germany

Modeling Aspects in Optical Metrology VIII

21 June 2021 | Online Only, Germany

Modeling Aspects in Optical Metrology VII

24 June 2019 | Munich, Germany

Modeling Aspects in Optical Metrology

26 June 2017 | Munich, Germany

Showing 5 of 10 Conference Committees

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