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The microchannel plate (MCP) as the most important component of image intensifiers and ultraviolet detectors, is avalanche two-dimensional electron multiplier device. The emission point as a pattern noise, which is characterized by a bright or a flickering point at a fixed position of the fluorescent screen, affects the visual quality and reliability of the MCP. Therefore, eliminating the emission point is an effective way to improve the performances of the MCP. In this paper, the inner wall morphology and structure defect of the channel were studied, the MCPs with different inner wall morphlogies were analyzed by SEM, and the emission point were tested by using the photoelectric imaging integrated tester. Using the above-mentioned research methods, a specific relationship between the inner wall morphology and the emission point was established. According to the field emission theory, the mechanism of the emission point was analyzed and discussed. The results show that the inner wall structure defects of the channel are the main reasons for the emission point. Furthermore, the study found that the matching of the thermal physical properties between core glass and clad glass is the main reason for the occurrence of structure defects. The structure defects of the inner wall can be effectively reduced by optimizing the composition of the glass material, make the two glasses have the suitable performance matching, avoid forming residual pores at the interface position, the inner wall of the channel will have a smooth, defect free microstructure, thereby effectively controlling the emission point of the MCP.
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