Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)

Fabian Friederich

doi:10.1117/12.2300758

14 March 2018 Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)

Fabian Friederich

Proceedings Volume 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI; 105310R (2018) https://doi.org/10.1117/12.2300758
Event: SPIE OPTO, 2018, San Francisco, California, United States

Abstract

We report on our recent industrial development projects on millimeter-wave and terahertz imaging solutions for non-destructive testing. This involves system realizations as well as their integration in industrial environments.

Conference Presentation

Citation Download Citation

Fabian Friederich "Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)", Proc. SPIE 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, 105310R (14 March 2018); https://doi.org/10.1117/12.2300758

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
PRESENTATION

WATCH
PRESENTATION SAVE TO MY LIBRARY

GET CITATION

KEYWORDS

Millimeter wave imaging

Nondestructive evaluation

RELATED CONTENT

Terahertz imaging system based on bessel beams via 3D printed...
Proceedings of SPIE (November 11 2014)

3D additive manufacturing non destructive characterization with terahertz waves (Conference...
Proceedings of SPIE (January 01 1900)

Terahertz imaging for nondestructive testing of materials for aerospace, automotive,...
Proceedings of SPIE (January 01 1900)

SAR millimeter wave imaging systems
Proceedings of SPIE (May 13 2019)

Enhanced terahertz imaging of electronic packaging materials with deconvolution algorithm
Proceedings of SPIE (March 12 2020)

Terahertz imaging technique and application in large scale integrated circuit...
Proceedings of SPIE (November 04 2010)

Printed terahertz metasurfaces for multipsectral imaging by thermo-conversion
Proceedings of SPIE (March 07 2022)

Subscribe to Digital Library

Receive Erratum Email Alert

Keywords/Phrases

Search In:

Publication Years