Aliasing artefact index for image interpolation quality assessment

Olivier Rukundo; Samuel E. Schmidt

doi:10.1117/12.2503872

7 November 2018 Aliasing artefact index for image interpolation quality assessment

Olivier Rukundo, Samuel E. Schmidt

Proceedings Volume 10817, Optoelectronic Imaging and Multimedia Technology V; 108171E (2018) https://doi.org/10.1117/12.2503872
Event: SPIE/COS Photonics Asia, 2018, Beijing, China

Abstract

A preliminary study of a non-reference aliasing artefact index (AAI) metric is presented in this paper. We focus on the effects of combining a full-reference metric and interpolation algorithm. The nearest neighbor algorithm (NN) is used as the gold standard against which test-algorithms are judged in terms of aliased structures. The structural similarity index (SSIM) metric is used to evaluate a test image (i.e. a test-algorithm’s image) and a reference image (i.e. the NN’s image). Preliminary experiments demonstrated promising effects of the AAI metric against state-of-the-art non-reference metrics mentioned. A new study may further develop the studied metric for potential applications in image quality adaptation and/or monitoring in medical imaging.

Citation Download Citation

Olivier Rukundo and Samuel E. Schmidt "Aliasing artefact index for image interpolation quality assessment", Proc. SPIE 10817, Optoelectronic Imaging and Multimedia Technology V, 108171E (7 November 2018); https://doi.org/10.1117/12.2503872

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