Presentation + Paper
23 March 2020 Challenge of >300W high power LPP-EUV source with long collector mirror lifetime for semiconductor HVM
Author Affiliations +
Abstract
Gigaphoton develops CO2-Sn-LPP EUV light source which is the most promising solution as the 13.5nm high power light source for HVM EUVL. Unique and original technologies including; combination of pulsed CO2 laser and Sn droplets, dual wavelength laser pulses for shooting and debris mitigation by magnetic field have been applied. We have developed first practical source for HVM; “GL200E” in 2014. Then it is demonstrated which high average power CO2 laser more than 20kW at output power in cooperation with Mitsubishi Electri. Pilot#1 is up running and it demonstrates HVM capability; EUV power recorded at 111W on average (117W in burst stabilized, 95% duty) with 5% conversion efficiency for 22 hour operation in October 2016. Availability is achievable at 89% (2 weeks average), also superior magnetic mitigation has demonstrated promising mirror degradation rate (= 0.5%/Gp) at 100W or higher power operation with dummy mirror test. We have demonstrated actual collector mirror reflectivity degradation rate is less than 0.4%/Gp by using real collector mirror around 125W (at I/F clean) in burst power during 30 Billion pulses operation. Recently we have redefined target power higher >330W and its development plan. Also we will update latest challenges for >330W average operation with actual collector mirror at the conference.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hakaru Mizoguchi, Hiroaki Nakarai, Tamotsu Abe, Hiroshi Tanaka, Yukio Watanabe, Tsukasa Hori, Yutaka Shiraishi, Tatsuya Yanagida, Georg Soumagne, Tsuyoshi Yamada, and Takashi Saitou "Challenge of >300W high power LPP-EUV source with long collector mirror lifetime for semiconductor HVM", Proc. SPIE 11323, Extreme Ultraviolet (EUV) Lithography XI, 113230X (23 March 2020); https://doi.org/10.1117/12.2549905
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Carbon dioxide lasers

Extreme ultraviolet

Mirrors

Tin

Plasma

Light sources

Extreme ultraviolet lithography

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