Characterization Of X-Ray Optics By Synchrotrcn Radiation

M. Kuhne; P. Muller

doi:10.1117/12.961827

27 November 1989 Characterization Of X-Ray Optics By Synchrotrcn Radiation

M. Kuhne, P. Muller

Proceedings Volume 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation; (1989) https://doi.org/10.1117/12.961827
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

A reflectometer has been set up at the radiometric laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY. The reflectometer is used in connection with a toroidal grating monochromator and operates primarily in the wavelength range from 5 nm to 40 nm. The instrumentation is described and examples are given for the characterization of multilayer mirrors and transmission gratings.

Citation Download Citation

M. Kuhne and P. Muller "Characterization Of X-Ray Optics By Synchrotrcn Radiation", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961827

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