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20 August 2020 Mapping structure-property relationships in 2D and 3D perovskites with ultrafast transient absorption and scanning electron correlation microscopy
Elad Harel
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Proceedings Volume 11464, Physical Chemistry of Semiconductor Materials and Interfaces XIX; 114640I (2020) https://doi.org/10.1117/12.2569286
Event: SPIE Nanoscience + Engineering, 2020, Online Only
Abstract
Scanning electron microscopy (SEM) correlated to transient absorption microscopy (TAM) is used to study heterogeneities in thin films of 3D perovskites. Statistical analysis of thousands of distinct spatial locations reveals the effects of grain boundaries and crystal size on carrier dynamics. Further, a new class of 2D perovskite materials is discovered by exploiting alloying of the organic cation. Spectroscopic and theoretical studies show that such structural deformation leads to a blue-shifted bandgap, sub-bandgap trap states with wider energetic distribution, and stronger photoluminescence quenching. These results and methods provide new insights for understanding the structure-property relationship in perovskite materials.
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Elad Harel "Mapping structure-property relationships in 2D and 3D perovskites with ultrafast transient absorption and scanning electron correlation microscopy", Proc. SPIE 11464, Physical Chemistry of Semiconductor Materials and Interfaces XIX, 114640I (20 August 2020); https://doi.org/10.1117/12.2569286
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KEYWORDS
Perovskite
Scanning electron microscopy
Absorption
Microscopy
Electron microscopy
Ultrafast phenomena
Metals
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