Poster + Paper
10 October 2020 Performance evaluation experiments on scanning probe microscope
Author Affiliations +
Conference Poster
Abstract
Nowadays, with 3D topographic features increasingly complicated and complex, scanning probe microscopes have widely been used of nano-scale dimensional measurement in the semiconductor manufacturing and space industry, which can create three-dimensional data over almost all solids in a wide range of ambient. Although scanning probe microscopes readily achieve nanometer level resolution images of measured surfaces, there are several aspects of their behavior that can cause them to yield large measurement errors. In this paper, according to possible traceability pathways for calibration of lateral axes and z axis, both pitch and step height measurements are respectively performed and axis error self-correction model is proposed. The influence of thermal stability on drift error is also discussed. Experimental results show that our method will be helpful for a fast performance evaluation test for scanning probe microscope.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sen Zhou, Yikun Xiong, Jin Zhou, and Tong Liu "Performance evaluation experiments on scanning probe microscope", Proc. SPIE 11556, Nanophotonics and Micro/Nano Optics VI, 115560L (10 October 2020); https://doi.org/10.1117/12.2572688
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KEYWORDS
Scanning probe microscopes

3D metrology

3D scanning

Calibration

Image resolution

Semiconductor manufacturing

Solids

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