Nowadays, with 3D topographic features increasingly complicated and complex, scanning probe microscopes have widely been used of nano-scale dimensional measurement in the semiconductor manufacturing and space industry, which can create three-dimensional data over almost all solids in a wide range of ambient. Although scanning probe microscopes readily achieve nanometer level resolution images of measured surfaces, there are several aspects of their behavior that can cause them to yield large measurement errors. In this paper, according to possible traceability pathways for calibration of lateral axes and z axis, both pitch and step height measurements are respectively performed and axis error self-correction model is proposed. The influence of thermal stability on drift error is also discussed. Experimental results show that our method will be helpful for a fast performance evaluation test for scanning probe microscope.
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