Presentation + Paper
20 May 2022 Multisection waveguide method for facet temperature reduction and improved reliability of high-power laser diodes
Author Affiliations +
Abstract
Catastrophic optical mirror damage (COMD) limits the output power and reliability of lasers diodes (LDs). Laser self heating together with facet absorption of output power cause the facet to reach a critical temperature (Tc), resulting in COMD and irreversible device failure. The self-heating of the laser contributes significantly to the facet temperature, but it has not been addressed so far. We implement a multi-section waveguide method where the heat is separated from reaching the output facet by exploiting an electrically isolated window. The laser waveguide is divided into two electrically isolated laser and transparent window sections. The laser section is pumped at high current levels to achieve laser output, and the passive waveguide is biased at low injection currents to obtain a transparent waveguide with negligible heat generation. Using this design, we demonstrate facet temperatures lower than the junction temperature of the laser even at high output power operation. While standard LDs show COMD failures, the multi-section waveguide LDs are COMD-free. Our technique and results provide a pathway for high-reliability LDs, which would find diverse applications in semiconductor lasers
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kaveh Ebadi, Yuxian Liu, Ali Kaan Sünnetçioglu, Sinan Gündogdu, Serdar Şengül, Yuliang Zhao, Yu Lan, Guowen Yang, and Abdullah Demir "Multisection waveguide method for facet temperature reduction and improved reliability of high-power laser diodes", Proc. SPIE 12141, Semiconductor Lasers and Laser Dynamics X, 1214104 (20 May 2022); https://doi.org/10.1117/12.2621651
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KEYWORDS
Waveguides

Reliability

Absorption

Temperature metrology

High power lasers

Electroluminescence

Diodes

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