Presentation + Paper
29 August 2022 Metasurface-based image slicers for integral field spectroscopy
Author Affiliations +
Abstract
Image slicers are now common equipment in integral field spectrographs (IFSes) to detect and analyze distant galaxies and extra-solar planets. However, tilted surfaces cause vignetting between adjacent slices and off-axis optical aberrations. In this paper, we explore how the flexibility of metasurfaces can be used by adjusting the surface phases on single glass planes and mirrors. Therefore, each slice can be defined by its nanopillar spatial distribution, enabling control of slitlet positions and aberrations. We propose a conceptual design of a six-slices metasurface-based image slicer (MIS), optimized to operate in the J band (1.15-1.35 μm). In addition to resulting in diffraction-limited performance, the dispersion inherent to metasurfaces allows reaching a R = 2850 spectral resolving power in a short 273 mm-long design, with a transmission < 85%.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tristan Chabot, Jeck Borne, Guillaume Bédard, and Simon Thibault "Metasurface-based image slicers for integral field spectroscopy", Proc. SPIE 12188, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V, 121880B (29 August 2022); https://doi.org/10.1117/12.2628825
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KEYWORDS
Nanostructures

Optical design

Spectrographs

Geometrical optics

Near infrared

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