Presentation + Paper
1 May 2023 High-aspect-ratio amorphous carbon mask etch profile control through plasma and surface chemistry optimization
Du Zhang, Shihsheng Chang, Pingshan Luan, Amrit Kaphle, Toru Hisamatsu, Jeffrey Shearer, Minjoon Park, Andrew Metz, Akiteru Ko, Peter Biolsi
Author Affiliations +
Abstract
The etch profile control for the amorphous carbon layer (ACL) is an important step in the 3D NAND fabrication process. Because ACL is the mask material for defining the pattern of the high-aspect-ratio-contact (HARC) dielectric ONON layer etch process, precise control of its etch profile is necessary. Specifically, an ideal ACL mask profile should be free of symptoms such as hole circularity distortion, profile twisting, bowing, and undercutting. In order to achieve this desired etch performance, knowledge of various etch contributing factors must be systematically derived and applied, including etch surface chemistry, high-aspect-ratio (HAR) etchant transport, ion flux and ion energy angle distribution function (EADF) control, etc. In this work, we investigate the ACL etch fundamental characteristics through combined 2D chamber-scale plasma simulations with the hybrid plasma-equipment model (HPEM) and 3D etch profile simulations with the Monte-Carlo Feature Profile Model (MCFPM) for an inductively-coupled-plasma (ICP) reactor with RF bias at the substrate. In particular, we focus on the profile trends under different reactant fluxes and energies. Our findings indicate that maintaining a neutral-starved (ion-rich) etch regime is essential for mitigating both the channel hole etch circularity distortion and the slit etch profile twisting. To achieve this desired etch regime, the HAR ion, and neutral transport must controlled by the RF bias power and frequency, substrate temperature, etc. Furthermore, especially in this neutral-limited etch regime which is necessary for distortion and twisting mitigation, the control of the consequent aspect-ratio dependent etching (ARDE), as well as maintaining the critical dimension (CD) and reducing bowing and undercutting are also necessary. For this purpose, atomistic density functional theory (DFT) calculations have been applied to compare the reaction energetics for various ALD-like sidewall passivation chemistries. Specifically, we propose a new process based on its favorable reaction energetics. Experimental cross-section images have matched simulation results. In conclusion, our insights have provided guidance for process optimization and tool design to meet industrial demands.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Du Zhang, Shihsheng Chang, Pingshan Luan, Amrit Kaphle, Toru Hisamatsu, Jeffrey Shearer, Minjoon Park, Andrew Metz, Akiteru Ko, and Peter Biolsi "High-aspect-ratio amorphous carbon mask etch profile control through plasma and surface chemistry optimization", Proc. SPIE 12499, Advanced Etch Technology and Process Integration for Nanopatterning XII, 1249906 (1 May 2023); https://doi.org/10.1117/12.2657285
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Etching

Ions

Plasma

Simulations

Distortion

Passivation

Plasma etching

Back to Top