Interferometric method for characterizing optical retarders

Jesus del Hoyo Muñoz; Joaquin Andres-Porras; Angela Soria-Garcia; Luis Miguel Sanchez-Brea; Veronica Pastor-Villarrubia; Mahmoud H. Elshorbagy; Javier Alda

doi:10.1117/12.3017592

18 June 2024 Interferometric method for characterizing optical retarders

Jesus del Hoyo Muñoz, Joaquin Andres-Porras, Angela Soria-Garcia, Luis Miguel Sanchez-Brea, Veronica Pastor-Villarrubia, Mahmoud H. Elshorbagy, Javier Alda

Author Affiliations +

Proceedings Volume 12997, Optics and Photonics for Advanced Dimensional Metrology III; 1299718 (2024) https://doi.org/10.1117/12.3017592
Event: SPIE Photonics Europe, 2024, Strasbourg, France

Conference Poster

Abstract

Optical retarders are essential for controlling polarization. Usual retarders are defined by two parameters: retardance and fast axis azimuth. Most characterizing procedures can determine only one of these parameters. Other methods require previously characterized retarders, are complex, or are restricted to certain experimental conditions. In this work, we present a simple interferometric method to fully characterize a retarder. It consists of using a dual path interferometer with polarization control. When the retarder is rotated, the interference pattern shifts, and the retarder parameters can be related to those shifts. We present two procedures to measure the pattern shift and calculate the retarder parameters, where each one presents different advantages.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Jesus del Hoyo Muñoz, Joaquin Andres-Porras, Angela Soria-Garcia, Luis Miguel Sanchez-Brea, Veronica Pastor-Villarrubia, Mahmoud H. Elshorbagy, and Javier Alda "Interferometric method for characterizing optical retarders", Proc. SPIE 12997, Optics and Photonics for Advanced Dimensional Metrology III, 1299718 (18 June 2024); https://doi.org/10.1117/12.3017592

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