Stray light technology overview of the 1980 decade (and a peek into the future)

Robert P. Breault

doi:10.1117/12.22643

1 December 1990 Stray light technology overview of the 1980 decade (and a peek into the future)

Robert P. Breault

Proceedings Volume 1331, Stray Radiation in Optical Systems; (1990) https://doi.org/10.1117/12.22643
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The accepted usefulness of detailed stray light analyses and BRDF data, has grown steadily and significantly since 1980. Today the usefulness of these analyses is clearly understood in most areas of the optical space research community. The Bidirectional Reflectance Distribution Function (BRDF), which defmes the scatter characteristics of surfaces, is a term familiar enough to the community that an ASTM standard is in the fmal stages of approval. The published literature now has significant amounts of BRDF data on an assortment of useful materials. Important space based systems have been analyzed for stray light, and then measured in operation. The conelation between the measured and analysis results has been very good. The software tools are more numerous, and they have more capability. There is much more theory documented in the literature. Some of the theory is still being argued about, to different degrees of disagreement, but the basic concepts are well established. Probably one of the most significant advances has been a series of contracts out of Rome Air Development Center (RADC) on the Detection, Removal, and Prevention of Contamination. These works hold great promise for the future.

Citation Download Citation

Robert P. Breault "Stray light technology overview of the 1980 decade (and a peek into the future)", Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); https://doi.org/10.1117/12.22643

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