Paper
1 August 1992 Design of a 6,032 element TDI CCD imager
Stephen J. Strunk, John R.F. McMacken, Stacy R. Kamasz, William D. Washkurak, Savvas G. Chamberlain, John A. Lund, William R. Pfister
Author Affiliations +
Proceedings Volume 1778, Imaging Technologies and Applications; (1992) https://doi.org/10.1117/12.130973
Event: Optical Engineering Midwest 1992, 1992, Chicago, IL, United States
Abstract
Time-delay and integration (TDI) CCD sensors have been proven to increase the effective sensitivity in linescan imaging applications. This paper describes the design and initial test results of a 6032 element, 32-stage TDI imager for airborne reconnaissance applications. The device is fabricated using a 3-poly 3-phase NMOS process, incorporating buried channel CCDs throughout. It is one-side buttable to produce an array of over 12,000 contiguous elements and is capable of read rates of over 4000 lines per second. For fast readout, the design incorporates dual horizontal CCDs for a total of four outputs in the abutted configuration. The architecture also allows dynamic selection in the number of TDI stages.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen J. Strunk, John R.F. McMacken, Stacy R. Kamasz, William D. Washkurak, Savvas G. Chamberlain, John A. Lund, and William R. Pfister "Design of a 6,032 element TDI CCD imager", Proc. SPIE 1778, Imaging Technologies and Applications, (1 August 1992); https://doi.org/10.1117/12.130973
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KEYWORDS
Charge-coupled devices

Imaging systems

Electrons

Imaging technologies

Amplifiers

Capacitance

Cadmium sulfide

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