Improvement of local strain measurement by grid method: new optical device and quasi-heterodyne technique

Jean-Christophe Dupre; Mario Cottron; Alexis Lagarde

doi:10.1117/12.162093

22 October 1993 Improvement of local strain measurement by grid method: new optical device and quasi-heterodyne technique

Jean-Christophe Dupre, Mario Cottron, Alexis Lagarde

Author Affiliations +

Proceedings Volume 2066, Industrial Optical Sensing and Metrology: Applications and Integration; (1993) https://doi.org/10.1117/12.162093
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

Among optical strain measurement methods, the grid method is a powerful one. Progresses in the technique of information processing have contributed to develop classical analysis (optical and numerical Fourier transform). We propose a new optical device that allows the interference of diffracted beams from two crossed gratings of parallel lines marked on the specimen surface. The analysis of the interference fringes during loading provides the geometry of the gratings and so leads to the strain determination. The proposed method is insensitive to the specimen translations and presents a range from 10⁵, with the use of a phase-shifting technique, to a few 10². Using experimental traction tests, we compare this method with the classical ones and we develop the performances of the proposed method (sensitivity and large measurement range).

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Jean-Christophe Dupre, Mario Cottron, and Alexis Lagarde "Improvement of local strain measurement by grid method: new optical device and quasi-heterodyne technique", Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); https://doi.org/10.1117/12.162093

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