Methods for CCD camera characterization

James C. Mullikin; Lucas J. van Vliet; H. Netten; Frank R. Boddeke; G. van der Feltz; Ian T. Young

doi:10.1117/12.175165

5 May 1994 Methods for CCD camera characterization

James C. Mullikin, Lucas J. van Vliet, H. Netten, Frank R. Boddeke, G. van der Feltz, Ian T. Young

Proceedings Volume 2173, Image Acquisition and Scientific Imaging Systems; (1994) https://doi.org/10.1117/12.175165
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States

Abstract

In this paper we present methods for characterizing CCD cameras. Interesting properties are linearity of photometric response, signal-to-noise ratio, sensitivity, dark current, and spatial frequency response. The techniques to characterize CCD cameras are carefully designed to assist one in selecting a camera to solve a certain problem. The methods described were applied to a variety of cameras: an Astromed TE3/A with P86000 chip, a Photometrics CC200 series with Thompson chip TH7882, a Photometrics CC200 series with Kodak chip KAF1400, a Xillix' Micro Imager 1400 with Kodak chip KAF1400, an HCS MXR CCD with a Philips chip and a Sony XC-77RRCE.

Citation Download Citation

James C. Mullikin, Lucas J. van Vliet, H. Netten, Frank R. Boddeke, G. van der Feltz, and Ian T. Young "Methods for CCD camera characterization", Proc. SPIE 2173, Image Acquisition and Scientific Imaging Systems, (5 May 1994); https://doi.org/10.1117/12.175165

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