Absolute calibration of flats for densely sampled data

Marie-Christine Zolcinski-Couet; Joseph A. Magner; David A. Zweig

doi:10.1117/12.218463

8 September 1995 Absolute calibration of flats for densely sampled data

Marie-Christine Zolcinski-Couet, Joseph A. Magner, David A. Zweig

Proceedings Volume 2536, Optical Manufacturing and Testing; (1995) https://doi.org/10.1117/12.218463
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Results from a new technique for the absolute calibration of flats are presented. This technique is mathematically exact and, in addition, computationally nonintensive compared to previous techniques. Hence it allows the calibration of flats to a high degree of precision over the entire surface. The accuracy of this new technique is demonstrated through simulated test cases. This technique is currently implemented in the manufacturing cycle of optics (RMS precision of approximately (lambda) /250 at a wavelength of .6328 microns).

Citation Download Citation

Marie-Christine Zolcinski-Couet, Joseph A. Magner, and David A. Zweig "Absolute calibration of flats for densely sampled data", Proc. SPIE 2536, Optical Manufacturing and Testing, (8 September 1995); https://doi.org/10.1117/12.218463

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