MODIS contamination control requirements and implementation

Ronald V. Peterson; Edward L. Schultz

doi:10.1117/12.258306

11 November 1996 MODIS contamination control requirements and implementation

Ronald V. Peterson, Edward L. Schultz

Proceedings Volume 2864, Optical System Contamination V, and Stray Light and System Optimization; (1996) https://doi.org/10.1117/12.258306
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The moderate resolution scanning spectroradiometer (MODIS) is a multiband scanning instrument containing low scatter optics whose performance depends on low particulate and molecular contamination levels. The derivation of the MODIS instrument cleanliness requirements is discussed, along with the contamination control necessary to ensure that the requirements are met and the performance of the MODIS instrument is not degraded. Representative cleanliness monitoring results from the protoflight model, currently being integrated and tested at Santa Barbara Remote Sensing (SBRS), are also presented.

Citation Download Citation

Ronald V. Peterson and Edward L. Schultz "MODIS contamination control requirements and implementation", Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); https://doi.org/10.1117/12.258306

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