Characterization of an amorphous-silicon fluoroscopic imager

Richard E. Colbeth; Maxwell J. Allen; Derek J. Day; David L. Gilblom; Martin E. Klausmeier-Brown; John M. Pavkovich; Edward J. Seppi; Edward G. Shapiro

doi:10.1117/12.274010

2 May 1997 Characterization of an amorphous-silicon fluoroscopic imager

Richard E. Colbeth, Maxwell J. Allen, Derek J. Day, David L. Gilblom, Martin E. Klausmeier-Brown, John M. Pavkovich, Edward J. Seppi, Edward G. Shapiro

Author Affiliations +

Proceedings Volume 3032, Medical Imaging 1997: Physics of Medical Imaging; (1997) https://doi.org/10.1117/12.274010
Event: Medical Imaging 1997, 1997, Newport Beach, CA, United States

Abstract

This paper describes a dual-mode, flat panel imaging system capable of both fluoroscopy and radiography. Two generations of large area sensing technology are described. The general system architecture incorporates both the high sensitivity and data throughput required for fluoroscopy with the large signal capacity, spatial resolution and form factor necessary for radiography.

Citation Download Citation

Richard E. Colbeth, Maxwell J. Allen, Derek J. Day, David L. Gilblom, Martin E. Klausmeier-Brown, John M. Pavkovich, Edward J. Seppi, and Edward G. Shapiro "Characterization of an amorphous-silicon fluoroscopic imager", Proc. SPIE 3032, Medical Imaging 1997: Physics of Medical Imaging, (2 May 1997); https://doi.org/10.1117/12.274010

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE