System for measuring thickness of opaque dielectric layers

Ryszard Hypszer; Jerzy Plucinski; Pawel Wierzba

doi:10.1117/12.266718

13 February 1997 System for measuring thickness of opaque dielectric layers

Ryszard Hypszer, Jerzy Plucinski, Pawel Wierzba

Proceedings Volume 3054, Optoelectronic and Electronic Sensors II; (1997) https://doi.org/10.1117/12.266718
Event: Optoelectronic and Electronic Sensors II, 1996, Szczyrk, Poland

Abstract

The subject of this paper is a system for measuring thickness of opaque dielectric layers using the change of the coefficient of the magnetic coupling of two coils. This circuit was designed for measurements of thickness of elements in boats made from epoxy-glass laminates. It can, however, be used everywhere, where the need occurs to make non-destructive thickness measurements of dielectric layers in the range from 5 to 30 mm with an accuracy of 0,5 mm.

Citation Download Citation

Ryszard Hypszer, Jerzy Plucinski, and Pawel Wierzba "System for measuring thickness of opaque dielectric layers", Proc. SPIE 3054, Optoelectronic and Electronic Sensors II, (13 February 1997); https://doi.org/10.1117/12.266718

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