Predicting bulk damage in NIF triple harmonic generators

Michael J. Runkel; W. H. Williams; James J. De Yoreo

doi:10.1117/12.344456

7 April 1999 Predicting bulk damage in NIF triple harmonic generators

Michael J. Runkel, W. H. Williams, James J. De Yoreo

Proceedings Volume 3578, Laser-Induced Damage in Optical Materials: 1998; (1999) https://doi.org/10.1117/12.344456
Event: Laser-Induced Damage in Optical Materials: 1998, 1998, Boulder, CO, United States

Abstract

Recently reported experiments have investigated the statistics of laser damage in KDP and KD*P. Automated damage tests have allowed cumulative failure and damage probability distributions to be constructed. Large area tests have investigated the feasibility of on-line laser conditioning and damage evolution for tripler harmonic generation crystal on the NIF. These test have shown that there is a nonzero probability of damage at NIF redline fluence and that the damage pinpoint density evolves exponentially with fluence.

Citation Download Citation

Michael J. Runkel, W. H. Williams, and James J. De Yoreo "Predicting bulk damage in NIF triple harmonic generators", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); https://doi.org/10.1117/12.344456

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available