Comparison of connected-component algorithms

Frederick M. Waltz; John W. V. Miller

doi:10.1117/12.360267

27 August 1999 Comparison of connected-component algorithms

Proceedings Volume 3836, Machine Vision Systems for Inspection and Metrology VIII; (1999) https://doi.org/10.1117/12.360267
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

The SKIPSM paradigm offers fast execution of a very wide range of binary, grey-scale, 3D, and color image-processing applications. In this paper the finite-state-machine approach is applied to one of the 'classical' problems of binary image processing: connected-component analysis. Execution-time results are presented, and compared for several examples to execution times for the very-efficient conventional method based on analysis of run-length-encoded data.

Citation Download Citation

Frederick M. Waltz and John W. V. Miller "Comparison of connected-component algorithms", Proc. SPIE 3836, Machine Vision Systems for Inspection and Metrology VIII, (27 August 1999); https://doi.org/10.1117/12.360267

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