Paper
22 August 2000 Materials impacts on micro-opto-electro-mechanical systems
Author Affiliations +
Proceedings Volume 4178, MOEMS and Miniaturized Systems; (2000) https://doi.org/10.1117/12.396478
Event: Micromachining and Microfabrication, 2000, Santa Clara, CA, United States
Abstract
Micro-Optical-Electro-Mechanical Systems (MOEMS) employ batch fabrication processes to construct miniature devices with macroscopic functionality. Surface micromachiend MOEMS structures are manufactured by the deposition and patterning of thin films. In marked contrast with conventional fabrication processes, the thin film materials used in surface micromachiend structures are formed as the device is processed. In general, the material properties of thin films are not controlled during deposition, and are only measured after processing is completed. Characterization techniques currently wafer curvature measurements and a variety of test structures. None of the thin film characterization techniques currently employed is entirely satisfactory and all methods rely on process repeatability to be useful. The ultimate optical performance of MOEMS depends directly on the materials properties of the thin films employed. Differing residual material stresses and residual stress gradients cause curvature which degrades the optical performance of nominally flat reflecting surfaces. For multilayer structures like most micromirrors curvature due to the bimetallic effect can not be ignored. Recent work in which foundry processes were used to fabricate low-0cost deformable mirrors for adaptive optics illustrates the impact of residual material stress on system level optical performance. In other MOEMS devices residual material stress can be exploited to produce unique structures. More precise monitoring and control of film stress during deposition remains as a challenge for MEMS and MOEMS. This paper will address the principal materials issues for MOEMS and suggest both design and process control solutions.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William D. Cowan "Materials impacts on micro-opto-electro-mechanical systems", Proc. SPIE 4178, MOEMS and Miniaturized Systems, (22 August 2000); https://doi.org/10.1117/12.396478
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KEYWORDS
Mirrors

Microopto electromechanical systems

Metals

Thin films

Actuators

Process control

Raman spectroscopy

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