Paper
23 August 2000 Feed-forward control for a lithography/etch sequence
Richard Oechsner, Thomas Tschaftary, Stefan Sommer, Lothar Pfitzner, Heiner Ryssel, Harald Gerath, Christine Baier, Martin Hafner
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Abstract
Feed-forward and feedback control are used to compensate for variations caused by processes or equipment. The variations may be due to e.g. aging or shift and they may occur within a single process step or within a process sequence. The application of advanced process control methods offer the possibility to reduce deviation of process centering and, therefore, improving process capability. In this work, we investigated the feed-forward concept applied for a lithography/etch sequence to control the deviation of the critical dimension of polysilicon wires and also the implementation of feed-forward control into existing manufacturing execution systems.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard Oechsner, Thomas Tschaftary, Stefan Sommer, Lothar Pfitzner, Heiner Ryssel, Harald Gerath, Christine Baier, and Martin Hafner "Feed-forward control for a lithography/etch sequence", Proc. SPIE 4182, Process Control and Diagnostics, (23 August 2000); https://doi.org/10.1117/12.410080
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Cited by 1 scholarly publication and 6 patents.
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KEYWORDS
Etching

Control systems

Dry etching

Manufacturing

Process control

Photoresist materials

Antireflective coatings

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