Application of artificial neural network to an inverse design of an electron gun's main lens

Yan Tu; Xuefei Zhong

doi:10.1117/12.451275

21 December 2001 Application of artificial neural network to an inverse design of an electron gun's main lens

Yan Tu, Xuefei Zhong

Proceedings Volume 4510, Charged Particle Detection, Diagnostics, and Imaging; (2001) https://doi.org/10.1117/12.451275
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Artificial neural network is used in the inverse design of an electron gun's main lens in this paper. The relationship between electron spot on the screen and the structure of the main lens is investigated. According to the requirement of the spot on the screen, the structure of the main lens is investigated. According to the requirement of the spot on the screen, the structure of the main lens can be obtained through the trained network in a short time. The complex electron optic simulation can be avoided. It shows that the artificial neural network method is an effective tool to solve the inverse designing problem in the electron optic system.

Citation Download Citation

Yan Tu and Xuefei Zhong "Application of artificial neural network to an inverse design of an electron gun's main lens", Proc. SPIE 4510, Charged Particle Detection, Diagnostics, and Imaging, (21 December 2001); https://doi.org/10.1117/12.451275

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