Paper
24 July 2002 Newly developed acrylic copolymers for ArF photoresist
Yoshihiro Kamon, Hikaru Momose, Hideaki Kuwano, Tadayuki Fujiwara, Masaharu Fujimoto
Author Affiliations +
Abstract
We have developed novel acrylic copolymers for ArF photoresist which have more etching durability than usual. The excellent one of those copolymers in handling contains 8- or 9- methacryloyloxy-4-oxatricyclo[5.2.1.02,6]decan-3-one (OTDMA) and (gamma) ,(gamma) -dimethyl-(alpha) -methylene-(gamma) -butyrolac tone (DMMB). OTDMA is a new methacrylic ester monomer having a lactone unit with bridged structure. DMMB introduces a lactone structure to the main chain of acrylic copolymers. It was suggested that the solubility of monomers depends on the hindrance of their polar group, and the role of the hydrophilic monomers has been discussed from the standpoint of the position of their hydrophilic parts.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshihiro Kamon, Hikaru Momose, Hideaki Kuwano, Tadayuki Fujiwara, and Masaharu Fujimoto "Newly developed acrylic copolymers for ArF photoresist", Proc. SPIE 4690, Advances in Resist Technology and Processing XIX, (24 July 2002); https://doi.org/10.1117/12.474263
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CITATIONS
Cited by 10 scholarly publications.
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KEYWORDS
Etching

Polymers

Photoresist materials

Lithography

Carbon

Computer simulations

Semiconducting wafers

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