Overview of SIM external calibration

Stuart B. Shaklan; Mark H. Milman; Joseph Catanzarite; Ipek Basdogan; Miltiadis V. Papalexandris; Lisa A. Sievers; Raymond Swartz

doi:10.1117/12.460737

26 February 2003 Overview of SIM external calibration

Stuart B. Shaklan, Mark H. Milman, Joseph Catanzarite, Ipek Basdogan, Miltiadis V. Papalexandris, Lisa A. Sievers, Raymond Swartz

Author Affiliations +

Proceedings Volume 4852, Interferometry in Space; (2003) https://doi.org/10.1117/12.460737
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

Like all astrometric instruments, the Space Interferometry Mission (SIM) suffers from field-dependent errors requiring calibration. Diffraction effects in the delay line, polarization rotations on corner cubes, and beam walk across imperfect optics, all contribute to field-distortion that is significantly larger than is acceptable. The bulk of the systematic error is linear across the field - that is, it results in magnification and rotation errors. We show that the linear terms are inconsequential to the performance of SIM because they are inseparable from baseline length and orientation errors. One approach to calibrating the higher-order terms is to perform 'external' calibration; that is, SIM periodically makes differential measurements of a field of bright stars whose positions are not precisely known. We describe the requirements and constraints on the external calibration process and lay the groundwork for a specific procedure detailed in accompanying papers.

Citation Download Citation

Stuart B. Shaklan, Mark H. Milman, Joseph Catanzarite, Ipek Basdogan, Miltiadis V. Papalexandris, Lisa A. Sievers, and Raymond Swartz "Overview of SIM external calibration", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); https://doi.org/10.1117/12.460737

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