Confocal luminescence microscopy characterization of optical waveguides produced by ion beam irradiation on LiF

Stefano Pelli; Massimo Brenci; Roberto Calzolai; Franco Quercioli; Bruno Tiribilli; Massimo Vassalli; A. Ghirelli; Marco Cremona; Joao A. M. Pereira; Giancarlo C. Righini

doi:10.1117/12.478329

19 June 2003 Confocal luminescence microscopy characterization of optical waveguides produced by ion beam irradiation on LiF

Stefano Pelli, Massimo Brenci, Roberto Calzolai, Franco Quercioli, Bruno Tiribilli, Massimo Vassalli, A. Ghirelli, Marco Cremona, Joao A. M. Pereira, Giancarlo C. Righini

Author Affiliations +

Proceedings Volume 4987, Integrated Optics: Devices, Materials, and Technologies VII; (2003) https://doi.org/10.1117/12.478329
Event: Integrated Optoelectronics Devices, 2003, San Jose, CA, United States

Abstract

Optical waveguides in lithium fluoride (LiF) crystals have been obtained by He⁺ ion beam irradiation. The waveguides have been characterized by several techniques. In particular, we describe here the application of confocal microscopy to their characterization and show the first results obtained. We have also carried out a preliminary evaluation of the potential of this technique for the assessment of structural and spectroscopic characteristics of the waveguides.

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Stefano Pelli, Massimo Brenci, Roberto Calzolai, Franco Quercioli, Bruno Tiribilli, Massimo Vassalli, A. Ghirelli, Marco Cremona, Joao A. M. Pereira, and Giancarlo C. Righini "Confocal luminescence microscopy characterization of optical waveguides produced by ion beam irradiation on LiF", Proc. SPIE 4987, Integrated Optics: Devices, Materials, and Technologies VII, (19 June 2003); https://doi.org/10.1117/12.478329

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